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IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders

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IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders

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IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders

Product Details Product details: The wedge probe is a new accessibility probe required by the standard of IEC 60950-1 Fig NAF.2(S5366) and NAF.3(S5370) as well as BS 60950.1108/260/CD for paper ...

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